Invention Application
- Patent Title: Nanosheet MEMS Sensor Device and Method of Manufacture
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Application No.: US17188849Application Date: 2021-03-01
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Publication No.: US20220274828A1Publication Date: 2022-09-01
- Inventor: Mark Douglas Hall , Tushar Praful Merchant , Anirban Roy
- Applicant: NXP B.V.
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Main IPC: B81C1/00
- IPC: B81C1/00

Abstract:
A nanosheet MEMS sensor device and method are described for integrating the fabrication of nanosheet transistors (61) and MEMS sensors (62) in a single nanosheet process flow by forming separate nanosheet transistor and MEMS sensor stacks (12A-16A, 12B-16B) of alternating Si and SiGe layers which are selectively processed to form gate electrodes (49A-C) which replace the silicon germanium layers in the nanosheet transistor stack, to form silicon fixed electrodes using silicon layers (13B-2, 15B-2) on a first side of the MEMS sensor stack, and to form silicon cantilever electrodes using silicon layers (13B-1, 15B-1) on a second side of the MEMS sensor stack by forming a narrow trench opening (54) in the MEMS sensor stack to expose and remove remnant silicon germanium layers on the second side in the MEMS sensor stack.
Public/Granted literature
- US11685647B2 Nanosheet MEMs sensor device and method of manufacture Public/Granted day:2023-06-27
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