Invention Application
- Patent Title: THREE-DIMENSIONAL POSITION MEASURING SYSTEM, MEASURING METHOD, AND STORAGE MEDIUM
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Application No.: US17667152Application Date: 2022-02-08
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Publication No.: US20220276049A1Publication Date: 2022-09-01
- Inventor: Takeshi KIKUCHI
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2021-031371 20210301
- Main IPC: G01C15/00
- IPC: G01C15/00 ; G01C15/06 ; G06F30/12 ; G06F30/13

Abstract:
A measuring system includes a surveying instrument including a distance-measuring section, an angle-measuring section, an imaging section, a drive section, and a communication section, a measuring marker to be carried by a worker, including a position sensor, a posture sensor, a laser emitting section, a laser light emission port, a distance meter, and a communication section, an eyewear device to be worn on the head of the worker, including a display, an imaging section, a position sensor, a posture sensor, and a communication section, and an arithmetic device configured to synchronize coordinate of the above devices, and calculate an identified three-dimensional position of the measurement point by image analysis from images imaged by the imaging sections of the surveying instrument and the eyewear device, and measures the identified three-dimensional positions of a plurality of the measurement points in the order in which measurement instructions were issued by the worker.
Public/Granted literature
- US12152883B2 Three-dimensional position measuring system, measuring method, and storage medium Public/Granted day:2024-11-26
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