Invention Application
- Patent Title: Measurement Method, Measurement Device, Measurement System, And Measurement Program
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Application No.: US17680453Application Date: 2022-02-25
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Publication No.: US20220276119A1Publication Date: 2022-09-01
- Inventor: Yoshihiro KOBAYASHI
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2021-029995 20210226
- Main IPC: G01M5/00
- IPC: G01M5/00

Abstract:
A measurement method includes: a high-pass filter processing step of performing high-pass filter processing on target data including a drift noise to generate drift noise reduction data in which the drift noise is reduced, a correction data estimation step of estimating, based on the drift noise reduction data, correction data corresponding to a difference between the drift noise reduction data and data obtained by removing the drift noise from the target data, and a measurement data generation step of generating measurement data by adding the drift noise reduction data and the correction data.
Public/Granted literature
- US11921012B2 Abnormality determination for bridge superstructure based on acceleration data Public/Granted day:2024-03-05
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