• Patent Title: ANALYSIS SYSTEM, METHOD, AND PROGRAM
  • Application No.: US17626204
    Application Date: 2019-07-17
  • Publication No.: US20220279007A1
    Publication Date: 2022-09-01
  • Inventor: Shunichi KINOSHITA
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • International Application: PCT/JP2019/028085 WO 20190717
  • Main IPC: H04L9/40
  • IPC: H04L9/40
ANALYSIS SYSTEM, METHOD, AND PROGRAM
Abstract:
An analysis system includes: a configuration information acquisition unit which acquires configuration information from an agent which collects the configuration information of a device by scanning the device included in a system to be diagnosed; a generation unit which generates one or more initial facts which indicates a situation relating to security in the system to be diagnosed or the device based on the configuration information; and an analysis unit which analyzes a flow of an attack which is executable in the system to be diagnosed based on the one or more initial facts.
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