Invention Application
- Patent Title: Machine Learning-Based Interactive Visual Monitoring Tool for High Dimensional Data Sets Across Multiple KPIs
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Application No.: US17752113Application Date: 2022-05-24
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Publication No.: US20220283695A1Publication Date: 2022-09-08
- Inventor: Ahmed Reda Mohamed Saeid Abdulaal , Bass Chorng
- Applicant: eBay Inc.
- Applicant Address: US CA San Jose
- Assignee: eBay Inc.
- Current Assignee: eBay Inc.
- Current Assignee Address: US CA San Jose
- Main IPC: G06F3/04842
- IPC: G06F3/04842 ; G06N3/04 ; H04L41/22 ; G06N20/20 ; G06N5/04 ; G06N3/08

Abstract:
Described are computing systems and methods configured to detect a small, but meaningful, anomaly within one or more metrics associated with a platform. The system displays visuals of the metrics so that a user monitoring the platform can effectively notice a problem associated with the anomaly and take appropriate action to remediate the problem. An operational visual includes a radar-based visual with a heatmap arranging metrics, and a node representing a state of the metrics. Moreover, the system uses an ensemble of unsupervised machine learning algorithms for multi-dimensional clustering of hundreds of thousands of monitored metrics. Via the visuals and the implementation of the machine learning algorithms, the described techniques provide an improved way of representing and simulating many metrics being monitored for a platform. Moreover, the techniques are configured to expose actionable and useful information associated with the platform in a manner that can be effectively interpreted.
Public/Granted literature
Information query
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