Invention Application
- Patent Title: ADHESIVE SUPPLEMENTARY MARKER AND ADHESIVE EXAMINATION MARKER SET
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Application No.: US17829584Application Date: 2022-06-01
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Publication No.: US20220287795A1Publication Date: 2022-09-15
- Inventor: Saeko NOMURA , Junya TANABE , Ryohei TODE , Tsukasa YAMAZAKI
- Applicant: TOPPAN INC.
- Applicant Address: JP Tokyo
- Assignee: TOPPAN INC.
- Current Assignee: TOPPAN INC.
- Current Assignee Address: JP Tokyo
- Priority: JP2019221550 20191206
- Main IPC: A61B90/00
- IPC: A61B90/00 ; C09J7/24 ; C09J7/38 ; C09J7/25 ; A61B5/0507 ; A61B5/00 ; A61L24/00 ; A61L24/04

Abstract:
An adhesive supplementary marker that is configured to be used together with an adhesive examination marker to be attached to an examination target of image diagnosis using microwaves, and that is configured to be disposed between the adhesive examination marker and the examination target and pressed toward the examination target by the adhesive examination marker in a state in which the adhesive examination marker is attached to the examination target. The adhesive supplementary marker includes a laminate including a base film having a thickness of 20 μm or less, and a pressure-sensitive adhesive layer configured to be attached to the examination target. The base film has a Young's modulus of 1.0 GPa or more.
Information query