Invention Application
- Patent Title: ELECTRONIC DEVICE AND OBJECT MEASUREMENT METHOD THEREOF
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Application No.: US17838415Application Date: 2022-06-13
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Publication No.: US20220309697A1Publication Date: 2022-09-29
- Inventor: Dongkeun OH , Jisung YOO , Beomsu KIM , Chanmin PARK , Kihuk LEE
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Priority: KR10-2019-0019536 20190219
- Main IPC: G06T7/60
- IPC: G06T7/60

Abstract:
According to an embodiment, an electronic device includes a display, a memory, and a processor operatively connected to the display and the memory. The memory stores instructions that cause the processor to generate first depth information in a first direction from an object, generate a first point cloud of the object based on the first depth information, generate a first bounding box containing one or more points of the first point cloud, generate second depth information in a second direction from the object, the second direction being different from the first direction, generate a second point cloud of the object based on the second depth information, generate a second bounding box containing one or more points of the second point cloud, generate a third bounding box by combining the first and second bounding boxes, and display the third bounding box on the display. Certain other embodiments are also possible.
Information query