Invention Application
- Patent Title: MEASUREMENT APPARATUS AND MEASUREMENT METHOD
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Application No.: US17642903Application Date: 2020-08-27
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Publication No.: US20220366560A1Publication Date: 2022-11-17
- Inventor: Hiromitsu NAKAGAWA , Takeshi TANAKA , Daisuke FUKUI
- Applicant: HITACHI HIGH-TECH CORPORATION
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP2019-236325 20191226
- International Application: PCT/JP2020/032451 WO 20200827
- Main IPC: G06T7/00
- IPC: G06T7/00 ; A61B5/11 ; A61B5/00 ; G06T7/73 ; G06T7/50

Abstract:
Provided is a measurement apparatus including a processor and a storage unit. The storage unit holds measurement data of each time point which is obtained by a photographing apparatus, and temporal-spatial constraints. The processor extracts a position of an object from the measurement data of each time point, determines whether the object satisfies the temporal-spatial constraints, and determines, based on a result of the determination on whether the object satisfies the temporal-spatial constraints, whether the object is an analysis target.
Information query