Invention Application
- Patent Title: DEEP LEARNING DEVICE AND SYSTEM INCLUDING THE SAME
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Application No.: US17529439Application Date: 2021-11-18
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Publication No.: US20220374680A1Publication Date: 2022-11-24
- Inventor: Young Jae KIM , Kae Weon YOU , Ji Ung LEE , Jun Haeng LEE , Kyoung Hoon KANG , Young Hak LEE
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2021-0065586 20210521,KR10-2021-0092932 20210715
- Main IPC: G06N3/04
- IPC: G06N3/04

Abstract:
A deep learning device and system including the same is provided. The deep learning device comprising processing circuitry configured to determine whether a received image is abnormal using an anomaly detection model; merge at least some vectors extracted from the anomaly detection model; input, to a probability approximation model, principal components generated by a principal component analysis (PCA) to detect whether out of distribution (OOD) occurs in data of the received image; store a result of the determinations; and extract at least some the data in which the OOD occurs, as target labeling, using a target labeling extraction model when a rate of the data in which the OOD occurs is greater than or equal to a threshold value, wherein the anomaly detection model determines whether the received image is abnormal using the target labeling.
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