Invention Application
- Patent Title: STANDARD SAMPLE FILM, METHOD FOR PRODUCING STANDARD SAMPLE FILM, STANDARD SAMPLE, SAMPLE SET, QUANTITATIVE ANALYSIS METHOD, AND TRANSFER FILM
-
Application No.: US17879775Application Date: 2022-08-03
-
Publication No.: US20220381737A1Publication Date: 2022-12-01
- Inventor: Takuro SUGIYAMA , Yuko TERAO , Yasuhiko HIRANA , Tetsuro OTSUKA , Akinori SUGISHIMA , Yasuharu SHIRAISHI , Takafumi HIRATA , Yoshiki MAKINO
- Applicant: FUJIFILM Corporation , THE UNIVERSITY OF TOKYO
- Applicant Address: JP Tokyo; JP Tokyo
- Assignee: FUJIFILM Corporation,THE UNIVERSITY OF TOKYO
- Current Assignee: FUJIFILM Corporation,THE UNIVERSITY OF TOKYO
- Current Assignee Address: JP Tokyo; JP Tokyo
- Priority: JP2020-019351 20200207,JP2020-198759 20201130
- Main IPC: G01N27/64
- IPC: G01N27/64 ; H01J49/10 ; H01J49/40
Abstract:
Provided are a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing an organic substance and having a small variation in signal intensity of an ion of a metal element depending on a measurement position; a standard sample; a method for producing a standard sample film; a sample set; a quantitative analysis method; and a transfer film. The standard sample film of the present invention is a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing a polymer and a metal element, and having a maximum height difference in film thickness of the standard sample film of 0.50 μm or less.
Information query
