- 专利标题: BIAS DETECTION AND EXPLAINABILITY OF DEEP LEARNING MODELS
-
申请号: US17786314申请日: 2020-08-28
-
公开(公告)号: US20220383167A1公开(公告)日: 2022-12-01
- 发明人: Janani Venugopalan , Sudipta Pathak , Wei Xia , Sanjeev Srivastava , Arun Ramamurthy
- 申请人: Siemens Corporation
- 申请人地址: US NJ Iselin
- 专利权人: Siemens Corporation
- 当前专利权人: Siemens Corporation
- 当前专利权人地址: US NJ Iselin
- 优先权: EP21178050.7 20210607
- 国际申请: PCT/US2020/048401 WO 20200828
- 主分类号: G06N7/00
- IPC分类号: G06N7/00 ; G06N3/063
摘要:
System and method for latent bias detection by artificial intelligence modeling of human decision making using time series prediction data and events data of survey participants along with personal characteristics data for the participants. A deep Bayesian model solves for a bias distribution that fits a modeled prediction distribution of time series event data and personal characteristics data to a prediction probability distribution derived by a recurrent neural network. Sets of group bias clusters are evaluated for key features of related personal characteristics. Causal graphs are defined from dependency graphs of the key features. Bias explainability is inferred by perturbation in the deep Bayesian model of a subset of features from the causal graph, determining which causal relationships are most sensitive to alter group membership of participants.
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06N | 基于特定计算模型的计算机系统 |
G06N7/00 | 基于特定数学模式的计算机系统 |