- 专利标题: BEAD APPEARANCE INSPECTION DEVICE AND BEAD APPEARANCE INSPECTION SYSTEM
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申请号: US17901482申请日: 2022-09-01
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公开(公告)号: US20220410322A1公开(公告)日: 2022-12-29
- 发明人: Toshinari MOHRI , Shoriki NARITA , Katsuaki OKUMA , Takamichi KOMATSU
- 申请人: Panasonic Intellectual Property Management Co., Ltd.
- 申请人地址: JP Osaka
- 专利权人: Panasonic Intellectual Property Management Co., Ltd.
- 当前专利权人: Panasonic Intellectual Property Management Co., Ltd.
- 当前专利权人地址: JP Osaka
- 优先权: JP2020-038207 20200305
- 主分类号: B23K31/02
- IPC分类号: B23K31/02 ; B23K9/095
摘要:
A bead appearance inspection device includes an acquisition unit that acquires input data related to a welding bead, a storage unit that stores a first determination standard and a second determination standard used for an inspection of a defect of the welding bead, a first determination unit that executes a first inspection determination on the welding bead, and k second determination units, where k is an integer of 1 or more, that execute a second inspection determination on the welding bead. An appearance inspection result of the welding bead is created and output by using a determination result indicating whether a first inspection result acquired by the first inspection determination satisfies the first determination standard and a determination result indicating whether a second inspection result satisfies the second determination standard.