• Patent Title: PARAMETER OPTIMIZATION DEVICE, PARAMETER OPTIMIZATION METHOD, AND PARAMETER OPTIMIZATION PROGRAM
  • Application No.: US17781539
    Application Date: 2019-12-06
  • Publication No.: US20230004810A1
    Publication Date: 2023-01-05
  • Inventor: Seiya SHIBATA
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • International Application: PCT/JP2019/047947 WO 20191206
  • Main IPC: G06N3/08
  • IPC: G06N3/08
PARAMETER OPTIMIZATION DEVICE, PARAMETER OPTIMIZATION METHOD, AND PARAMETER OPTIMIZATION PROGRAM
Abstract:
A parameter optimization device 800 optimizes input CNN structure information and outputs optimized CNN structure information, and includes stride and dilation use layer detection means 811 for extracting stride and dilation parameter information for each convolution layer from the input CNN structure information, and stride and dilation use position modification means 812 for changing the stride and dilation parameter information of the convolution layer.
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