Invention Publication
- Patent Title: TRANSPORT DEVICE INSPECTION SYSTEM INCLUDING DIAGNOSTIC SERVER AND METHOD OF OPERATION THEREOF
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Application No.: US17721502Application Date: 2022-04-15
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Publication No.: US20230152775A1Publication Date: 2023-05-18
- Inventor: JUHO YANG , HEESOO PARK , JOUNGTAEK YOON , WONGEUN LEE , JUSUNG LEE
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR 20210159158 2021.11.18
- Main IPC: G05B19/406
- IPC: G05B19/406 ; H04L67/12

Abstract:
A transport device inspection system includes a plurality of transport devices configured to move along a transport path, a diagnostic server configured to create inspection schedule information for the plurality of transport devices, an inspector configured to receive the inspection schedule information from the diagnostic server and to sequentially inspect the plurality of transport devices in accordance with the inspection schedule information, and a transport device controller configured to receive the inspection schedule information from the inspector and to control the plurality of transport devices to sequentially move to an inspection position in accordance with the inspection schedule information.
Information query
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