Invention Publication
- Patent Title: FOCUSING LINEAR MODEL CORRECTION AND LINEAR MODEL CORRECTION FOR MULTIVARIATE CALIBRATION MODEL MAINTENANCE
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Application No.: US18151632Application Date: 2023-01-09
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Publication No.: US20230160812A1Publication Date: 2023-05-25
- Inventor: Lan SUN , Changmeng HSIUNG
- Applicant: VIAVI Solutions Inc.
- Applicant Address: US AZ Chandler
- Assignee: VIAVI Solutions Inc.
- Current Assignee: VIAVI Solutions Inc.
- Current Assignee Address: US AZ Chandler
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G06F17/18

Abstract:
A device may obtain a master beta coefficient of a master calibration model associated with a master instrument. The master beta coefficient may be at a grid of a target instrument. The device may perform constrained optimization of an objective function, in accordance with a set of constraints, in order to determine a pair of transferred beta coefficients. The constrained optimization may be performed based on an initial pair of transferred beta coefficients, the master beta coefficient, and spectra associated with a scouting set. The device may determine, based on the pair of transferred beta coefficients, a transferred beta coefficient. The device may determine a final transferred beta coefficient based on a set of transferred beta coefficients including the transferred beta coefficient. The final transferred beta coefficient may be associated with generating a transferred calibration model, corresponding to the master calibration model, for use by the target instrument.
Public/Granted literature
- US12174110B2 Focusing linear model correction and linear model correction for multivariate calibration model maintenance Public/Granted day:2024-12-24
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