Invention Publication
- Patent Title: DEVICES AND METHODS FOR MEASURING A MAGNETIC FIELD GRADIENT
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Application No.: US18147170Application Date: 2022-12-28
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Publication No.: US20230160979A1Publication Date: 2023-05-25
- Inventor: Nicolas Dupre , Yves Bidaux
- Applicant: Melexis Technologies SA
- Applicant Address: CH Bevaix
- Assignee: Melexis Technologies SA
- Current Assignee: Melexis Technologies SA
- Current Assignee Address: CH Bevaix
- Priority: EP 165059.5 2020.03.23
- Main IPC: G01R33/022
- IPC: G01R33/022 ; G01R33/00 ; G01R33/07

Abstract:
A method of determining a gradient of a magnetic field, includes the steps of: biasing a first/second magnetic sensor with a first/second biasing signal; measuring and amplifying a first/second magnetic sensor signal; measuring a temperature and/or a stress difference; adjusting at least one of: the second biasing signal, the second amplifier gain, the amplified and digitized second sensor value using a predefined function f(T) or f(T, ΔΣ) or f(ΔΣ) of the measured temperature and/or the measured differential stress before determining a difference between the first/second signal/value derived from the first/second sensor signal. A magnetic sensor device is configured for performing this method, as well as a current sensor device, and a position sensor device.
Public/Granted literature
- US11846687B2 Devices and methods for measuring a magnetic field gradient Public/Granted day:2023-12-19
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