Invention Publication
- Patent Title: SURVEY SYSTEM AND METHOD FOR CONTROLLING THE SURVEY SYSTEM
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Application No.: US18070258Application Date: 2022-11-28
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Publication No.: US20230168377A1Publication Date: 2023-06-01
- Inventor: Takeshi KIKUCHI , Yuji TAKANO
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP 21195011 2021.11.30
- Main IPC: G01S17/42
- IPC: G01S17/42 ; G01S7/481 ; G01S17/86 ; G06T7/70

Abstract:
A survey system includes: a target unit; a surveying instrument configured to transmit distance-measuring light to the target and receive reflected distance-measuring light to measure a distance and an angle to the target; an eyewear display device including a display; and a processor configured to synchronize information on positions and directions of the eyewear display device, the surveying instrument, and data in an absolute coordinate system. The processor causes the display to display a measurement point superimposing on a landscape of a survey site, to irradiate a target position set at the measurement point, calculated from three-dimensional position coordinates of the measurement point and a target height, with a guide distance-measuring light, and, in a state where an irradiation direction of the guide distance-measuring light and a center of the target actually set at the measurement point are matched, the surveying instrument is caused to measure the center of the target.
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