• 专利标题: X-RAY INSPECTION APPARATUS
  • 申请号: US17924194
    申请日: 2021-10-07
  • 公开(公告)号: US20230175987A1
    公开(公告)日: 2023-06-08
  • 发明人: Osamu KINOSHITAToshihiko MIYAIRI
  • 申请人: JED CO., LTD
  • 申请人地址: JP Azumino-shi, Nagano
  • 专利权人: JED CO., LTD
  • 当前专利权人: JED CO., LTD
  • 当前专利权人地址: JP Azumino-shi, Nagano
  • 优先权: JP 20191471 2020.11.18
  • 国际申请: PCT/JP2021/037106 2021.10.07
  • 进入国家日期: 2022-11-09
  • 主分类号: G01N23/046
  • IPC分类号: G01N23/046 G01N23/083
X-RAY INSPECTION APPARATUS
摘要:
In an X-ray inspection apparatus, an X-ray detector starts to acquire an X-ray image before a motor is started and outputs a periodic acquisition timing signal of the X-ray image, a generation circuit control unit generates a motor start signal based on a first signal generated from the acquisition timing signal, and a start signal generation circuit generates and outputs a controller start signal to a controller at an output timing of the acquisition timing signal after receiving the motor start signal. A CT image is generated based on a plurality of the X-ray images that are acquired after a rotation speed of the motor reaches a fixed speed.
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