发明公开
- 专利标题: X-RAY INSPECTION APPARATUS
-
申请号: US17924194申请日: 2021-10-07
-
公开(公告)号: US20230175987A1公开(公告)日: 2023-06-08
- 发明人: Osamu KINOSHITA , Toshihiko MIYAIRI
- 申请人: JED CO., LTD
- 申请人地址: JP Azumino-shi, Nagano
- 专利权人: JED CO., LTD
- 当前专利权人: JED CO., LTD
- 当前专利权人地址: JP Azumino-shi, Nagano
- 优先权: JP 20191471 2020.11.18
- 国际申请: PCT/JP2021/037106 2021.10.07
- 进入国家日期: 2022-11-09
- 主分类号: G01N23/046
- IPC分类号: G01N23/046 ; G01N23/083
摘要:
In an X-ray inspection apparatus, an X-ray detector starts to acquire an X-ray image before a motor is started and outputs a periodic acquisition timing signal of the X-ray image, a generation circuit control unit generates a motor start signal based on a first signal generated from the acquisition timing signal, and a start signal generation circuit generates and outputs a controller start signal to a controller at an output timing of the acquisition timing signal after receiving the motor start signal. A CT image is generated based on a plurality of the X-ray images that are acquired after a rotation speed of the motor reaches a fixed speed.
信息查询