发明公开
- 专利标题: Methods and Systems for Performing Diagnostic Processes with Reduced Processing Time
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申请号: US18106741申请日: 2023-02-07
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公开(公告)号: US20230176129A1公开(公告)日: 2023-06-08
- 发明人: Antoni Ferre Fabregas , Jose Gabriel Fernandez Banares
- 申请人: Lear Corporation
- 申请人地址: US MI Southfield
- 专利权人: Lear Corporation
- 当前专利权人: Lear Corporation
- 当前专利权人地址: US MI Southfield
- 分案原申请号: US16191680 2018.11.15
- 主分类号: G01R31/36
- IPC分类号: G01R31/36 ; G07C5/08 ; G01R31/00 ; G01R27/02
摘要:
Operation for performing diagnostics, such as vehicle diagnostics including short circuit and low impedance diagnostics during a high-voltage (HV) battery pre-charging a power-net of the vehicle and including insulation resistance monitoring diagnostics for measuring an insulation resistance between the power-net and another power-net, with reduced processing time includes measuring a physical parameter (voltage or current signal) as the parameter is being generated by a device-under-test to which the diagnostic process pertains. The diagnostic process requires a stable value of the parameter. The parameter variates while being generated during a beginning time and is stable while being generated during an ending time. While the parameter is being generated during the beginning time, a stable value of the parameter which the parameter will have during the ending time is predicted. The stable value of the parameter is predicted based on variation of measured values of the parameter during the beginning time.
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