Invention Publication
- Patent Title: FIN FIELD-EFFECT TRANSISTOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
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Application No.: US17545209Application Date: 2021-12-08
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Publication No.: US20230178372A1Publication Date: 2023-06-08
- Inventor: Bhaskar Srinivasan , Walter Scott Idol , Ming-Yeh Chuang , Brian Goodlin
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Main IPC: H01L21/225
- IPC: H01L21/225 ; H01L29/66

Abstract:
A fin field-effect transistor (“FinFET”) semiconductor device and method of forming the same. In one example, a semiconductor fin is formed over a semiconductor substrate. A conformal dielectric layer is formed on a top and side surfaces of the fin. A doped semiconductor layer is formed over the conformal dielectric layer, the doped semiconductor layer including a dopant. The doped semiconductor layer is heated thereby driving the dopant through the conformal dielectric layer and forming a doped region of the fin.
Information query
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