- 专利标题: FIN TIP POSITION MEASUREMENT METHOD, FIN TIP POSITION MEASUREMENT SYSTEM, AND JIG FOR MEASURING FIN TIP POSITION
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申请号: US17902337申请日: 2022-09-02
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公开(公告)号: US20230020601A1公开(公告)日: 2023-01-19
- 发明人: Shunsuke MIZUMI , Jose Carlos KUROKI RAMIREZ , Koji ISHIBASHI , Juichi KODERA , Satoshi KUMAGAI , Masaru SEKIHARA
- 申请人: MITSUBISHI HEAVY INDUSTRIES, LTD.
- 申请人地址: JP Tokyo
- 专利权人: MITSUBISHI HEAVY INDUSTRIES, LTD.
- 当前专利权人: MITSUBISHI HEAVY INDUSTRIES, LTD.
- 当前专利权人地址: JP Tokyo
- 优先权: JP2020-065281 20200331
- 主分类号: G01N21/90
- IPC分类号: G01N21/90 ; F01D5/20
摘要:
This fin tip position measurement method comprises: a jig installation step for installing a jig having a flat measurement surface expanded in a circumferential direction and an axial direction to a tip of at least one among a plurality of seal fins that protrude in a radial direction with respect to an axial line, extend in the circumferential direction, and are arranged in a direction in which the axial line extends; a first measurement step for measuring a distance from the axial line to the measurement surface by scanning the measurement surface with a laser beam; and a first calculation step for calculating a distance from the axial line to the tip of the seal fin by adding a radial dimension of the jig to the distance to the measurement surface.
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