- 专利标题: TEST SYSTEM AND MAIN DEVICE AND ADDITIONAL DEVICE THEREOF FOR TESTING AN ELECTRIC DEVICE
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申请号: US17998220申请日: 2021-05-11
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公开(公告)号: US20230228817A1公开(公告)日: 2023-07-20
- 发明人: Klaus Studer , Reinhard Kaufmann , Michael Rädler , Boris Unterer , Wernich De Villiers , Matthias Kukuk , Felix Feustel , Lukas Bitschnau , Horst Schedler
- 申请人: Omicron electronics GmbH
- 申请人地址: AT Klaus
- 专利权人: Omicron electronics GmbH
- 当前专利权人: Omicron electronics GmbH
- 当前专利权人地址: AT Klaus
- 优先权: AT 04162020 2020.05.13
- 国际申请: PCT/EP2021/062460 2021.05.11
- 进入国家日期: 2022-11-08
- 主分类号: G01R31/327
- IPC分类号: G01R31/327 ; G01R1/04 ; G01R31/16
摘要:
A test system (10) for testing an electric device (30), in particular a high-voltage device, has a portable main device (100) with a housing (140), an electric connection assembly (120, 121) and a mechanical connection assembly (145) and has a portable additional device (200, 300) with a separate housing (240, 340), an electric connection assembly (220, 320) and a mechanical connection assembly (245). The main device (100) can be mechanically connected to the additional device (200, 300) in a releasable manner by coupling the mechanical connection assemblies (145, 245) to form a structural unit, wherein the main device (100) can be electrically connected to the additional device (200, 300) via the first electric connection assemblies (120, 121, 220, 320).
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