- 专利标题： Focus Adjustment Method For Holographic Imaging System
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申请号： US18012045申请日： 2021-06-23
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公开(公告)号： US20230236542A1公开(公告)日： 2023-07-27
- 发明人: Nicolas Faure , Frédéric Pinston , Corinne Fournier , Loïc Denis , Thomas Olivier
- 申请人： Biomerieux , Universite Jean Monnet Saint Etienne , Centre National de la Recherche Scientifique (CNRS)
- 申请人地址： FR Marcy L'etoile
- 专利权人： Biomerieux,Universite Jean Monnet Saint Etienne,Centre National de la Recherche Scientifique (CNRS)
- 当前专利权人： Biomerieux,Universite Jean Monnet Saint Etienne,Centre National de la Recherche Scientifique (CNRS)
- 当前专利权人地址： FR Marcy L'etoile; FR Saint-Etienne; FR Paris
- 优先权： FR 06613 2020.06.24
- 国际申请： PCT/FR2021/051141 2021.06.23
- 进入国家日期： 2022-12-21
- 主分类号： G03H1/04
- IPC分类号： G03H1/04 ; G03H1/02 ; G03H1/08 ; G03H1/00
摘要：
A focus adjustment method for acquiring an image of a surface of interest of a sample by a holographic imager includes the steps of:
placing the sample including at least one reference object having a known shape and described by characterising parameters having at least position parameters
acquiring an image and determining the position of the reference object with respect to the acquisition plane, by applying a light diffraction model involving the spatial parameters of the reference object estimated by approximating the appearance of the reference object in the holographic image acquired, and
determining the position of the surface of interest with respect to the acquisition plane from a position of the reference object and focus adjustment of the image acquisition.
placing the sample including at least one reference object having a known shape and described by characterising parameters having at least position parameters
acquiring an image and determining the position of the reference object with respect to the acquisition plane, by applying a light diffraction model involving the spatial parameters of the reference object estimated by approximating the appearance of the reference object in the holographic image acquired, and
determining the position of the surface of interest with respect to the acquisition plane from a position of the reference object and focus adjustment of the image acquisition.
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