- 专利标题: MEASURING DEVICE AND MEASURING SYSTEM
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申请号: US17768438申请日: 2020-09-18
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公开(公告)号: US20230251076A1公开(公告)日: 2023-08-10
- 发明人: Tadao SENRIUCHI , Sadaharu YONEDA
- 申请人: TDK Corporation
- 申请人地址: JP Tokyo
- 专利权人: TDK Corporation
- 当前专利权人: TDK Corporation
- 当前专利权人地址: JP Tokyo
- 优先权: JP 19190609 2019.10.17 JP 20031137 2020.02.27
- 国际申请: PCT/JP2020/035638 2020.09.18
- 进入国家日期: 2022-04-12
- 主分类号: G01B7/16
- IPC分类号: G01B7/16 ; G01L1/16 ; B60C23/06
摘要:
Provided is a measuring device capable of enhancing convenience. The measuring device 1 comprises a first sensor 2 provided on a surface of an object 11 to be measured, an elastic body 3 that clamps the first sensor 2 between the elastic body 3 and the object 11 to be measured, a protective sheet 4 provided on the surface of the elastic body 3 on the side of the object 11 to be measured, a case 5 provided on the surface of the elastic body 3 on a side opposite from the object 11 to be measured, and a processing circuit 8 which is provided inside the case 5 and processes an output signal from the first sensor 2. The first sensor 2 is provided between the elastic body 3 and the protective sheet 4. The first sensor 2 is a strain sensor and includes a thin film piezoelectric element. The elastic body 3 is made of foamed rubber.
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