• 专利标题: MEASURING DEVICE AND MEASURING SYSTEM
  • 申请号: US17768438
    申请日: 2020-09-18
  • 公开(公告)号: US20230251076A1
    公开(公告)日: 2023-08-10
  • 发明人: Tadao SENRIUCHISadaharu YONEDA
  • 申请人: TDK Corporation
  • 申请人地址: JP Tokyo
  • 专利权人: TDK Corporation
  • 当前专利权人: TDK Corporation
  • 当前专利权人地址: JP Tokyo
  • 优先权: JP 19190609 2019.10.17 JP 20031137 2020.02.27
  • 国际申请: PCT/JP2020/035638 2020.09.18
  • 进入国家日期: 2022-04-12
  • 主分类号: G01B7/16
  • IPC分类号: G01B7/16 G01L1/16 B60C23/06
MEASURING DEVICE AND MEASURING SYSTEM
摘要:
Provided is a measuring device capable of enhancing convenience. The measuring device 1 comprises a first sensor 2 provided on a surface of an object 11 to be measured, an elastic body 3 that clamps the first sensor 2 between the elastic body 3 and the object 11 to be measured, a protective sheet 4 provided on the surface of the elastic body 3 on the side of the object 11 to be measured, a case 5 provided on the surface of the elastic body 3 on a side opposite from the object 11 to be measured, and a processing circuit 8 which is provided inside the case 5 and processes an output signal from the first sensor 2. The first sensor 2 is provided between the elastic body 3 and the protective sheet 4. The first sensor 2 is a strain sensor and includes a thin film piezoelectric element. The elastic body 3 is made of foamed rubber.
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