- 专利标题: METHOD OF CONICAL ANISOTROPIC RIGOROUS COUPLED WAVE ANALYSIS FOR GRATING AND COMPUTING DEVICE
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申请号: US17666717申请日: 2022-02-08
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公开(公告)号: US20230251500A1公开(公告)日: 2023-08-10
- 发明人: Lingshan Li
- 申请人: Goertek Inc.
- 申请人地址: CN Weifang
- 专利权人: Goertek Inc.
- 当前专利权人: Goertek Inc.
- 当前专利权人地址: CN Weifang
- 主分类号: G02B27/44
- IPC分类号: G02B27/44 ; G02B27/42 ; G02B27/01 ; G02B5/18 ; G06F17/11
摘要:
A method of conical anisotropic rigorous coupled wave analysis for grating and a computing device are disclosed. The method comprises: obtaining a target geometric phase δ′g for the anisotropic-material-based grating; obtaining a slow axis azimuth angle ϕc(x) of the anisotropic-material-based grating according to the target geometric phase δ′g; obtaining a permittivity tensor of the anisotropic-material-based grating, wherein the anisotropic-material-based grating has an ordinary index no and an extraordinary index ne, the anisotropic-material-based grating has a slow axis polar angle θc and slow axis azimuth angle ϕc(x), and the permittivity tensor is based on no, ne, θc and ϕc(x); applying the permittivity tensor into Maxwell equations; obtaining electromagnetic field for the anisotropic-material-based grating by using boundary conditions of at least two layers or sublayers of the anisotropic-material-based grating and Maxwell equations for each layer or sublayer, to obtain a diffraction efficiency for the anisotropic-material-based grating.
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