- 专利标题： BIOMETRIC INFORMATION MEASUREMENT SYSTEM AND METHOD
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申请号： US17957427申请日： 2022-09-30
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公开(公告)号： US20230025214A1公开(公告)日： 2023-01-26
- 发明人: Franklin Don Bien
- 申请人： UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- 申请人地址： KR Ulju-Gun
- 专利权人： UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- 当前专利权人： UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE AND TECHNOLOGY)
- 当前专利权人地址： KR Ulju-Gun
- 优先权： KR10-2020-0038203 20200330,KR10-2021-0039556 20210326
- 主分类号： A61B5/00
- IPC分类号： A61B5/00 ; H02J50/00 ; H04W4/80
摘要：
A biometric information measurement system and method are disclosed. A biometric information measurement system according to an embodiment of the present invention may comprise an implant device that is inserted into the human body so as to measure biometric information and an external device that transmits a signal to the implantable device while sweeping a frequency.
公开/授权文献
- US11918320B2 Biometric information measurement system and method 公开/授权日：2024-03-05
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