Invention Publication
- Patent Title: SENSOR CALIBRATION
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Application No.: US17675725Application Date: 2022-02-18
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Publication No.: US20230266147A1Publication Date: 2023-08-24
- Inventor: Diyan TENG , Junsheng HAN , Victor KULIK , Mehul SOMAN , Rashmi KULKARNI
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Dego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Dego
- Main IPC: G01C25/00
- IPC: G01C25/00 ; G01P21/00

Abstract:
Systems and techniques are described herein. For example, a process can include obtaining first sensor measurement data associated with a and second sensor measurement from one or more sensors. In some cases, the first measurement data can be associated with a first time and the second sensor measurement data can be associated with a second time occurring after the first time. In some aspects, the process includes determining that the first sensor measurement data and the second sensor measurement data satisfy at least one batching condition. In some examples, the process includes, based on determining that the first sensor measurement data and the second sensor measurement data satisfy the at least one batching condition, generating a sensor measurement data batch including the first sensor measurement data, the second sensor measurement data, and at least one target sensor measurement data. Ins examples the process includes outputting the sensor measurement data batch.
Public/Granted literature
- US11821754B2 Sensor calibration Public/Granted day:2023-11-21
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