- 专利标题： PLATFORM, SYSTEMS, AND METHODS FOR IDENTIFYING CHARACTERISTICS AND CONDITIONS OF PROPERTY FEATURES THROUGH IMAGERY ANALYSIS
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申请号： US18196194申请日： 2023-05-11
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公开(公告)号： US20230281447A1公开(公告)日： 2023-09-07
- 发明人: Takeshi Okazaki
- 申请人： Aon Benfield Inc.
- 申请人地址： US IL Chicago
- 专利权人： Aon Benfield Inc.
- 当前专利权人： Aon Benfield Inc.
- 当前专利权人地址： US IL Chicago
- 主分类号： G06N3/08
- IPC分类号： G06N3/08 ; G06N20/20 ; G06T7/00 ; G06F18/241 ; G06V10/764 ; G06V10/82 ; G06V20/10 ; G06V10/46 ; G06V20/13
摘要：
In an illustrative embodiment, methods and systems for automatically categorizing a condition of a property characteristic may include obtaining aerial imagery of a geographic region including the property, identifying features of the aerial imagery corresponding to the property characteristic, analyzing the features to determine a property characteristic classification, and analyzing a region of the aerial imagery including the property characteristic to determine a condition classification.
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