发明公开
- 专利标题: METHOD FOR LEAK TESTING
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申请号: US18022662申请日: 2020-09-09
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公开(公告)号: US20230314267A1公开(公告)日: 2023-10-05
- 发明人: Tomoyuki FUTAMI , Takaaki WATANABE , Akimitsu TANABE
- 申请人: FUKUDA CO., LTD.
- 申请人地址: JP Tokyo
- 专利权人: FUKUDA CO., LTD.
- 当前专利权人: FUKUDA CO., LTD.
- 当前专利权人地址: JP Tokyo
- 国际申请: PCT/JP2020/034125 2020.09.09
- 进入国家日期: 2023-02-22
- 主分类号: G01M3/20
- IPC分类号: G01M3/20
摘要:
The present invention provides a method for leak testing by which occurrence of fine leakage from a work as a test object can be determined without being affected by a released tracer gas that is also released from a non-defective work. The method for leak testing includes a series of steps including a gas bombing step wherein a work W as a test object is soaked in a pressurized tracer gas, a work setting step wherein the work subjected to the gas bombing is set in a hermetically sealed container 10, a vacuum suctioning step wherein the hermetically sealed container 10 is vacuum suctioned by a suction device 20 and a measuring step wherein tracer gas measurement data are obtained by measuring a vacuum suctioned tracer gas with a detector 30. Tracer gas measurement data for a non-defective work are preliminarily obtained by performing the series of steps for the non-defective work having same specifications as the work W as the test object. The tracer gas measurement data for the work W as the test object are compared with the tracer gas measurement data for the non-defective work in the measuring step, and thereby, occurrence of fine leakage from the work as the test object is determined.
公开/授权文献
- US3230128A Method of manufacturing key levers for musical instruments 公开/授权日:1966-01-18
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