发明公开
- 专利标题: FLAW ANALYSIS OF IMAGES
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申请号: US18358208申请日: 2023-07-25
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公开(公告)号: US20230368260A1公开(公告)日: 2023-11-16
- 发明人: Dane Glasgow , David Eramian , Sandy Godsey , Justin VanWinkle
- 申请人: eBay Inc.
- 申请人地址: US CA San Jose
- 专利权人: eBay Inc.
- 当前专利权人: eBay Inc.
- 当前专利权人地址: US CA San Jose
- 主分类号: G06Q30/06
- IPC分类号: G06Q30/06 ; G06T5/00 ; G06T7/00 ; G06V30/416
摘要:
Systems and methods are disclosed to provide flaw accentuation to an image in an e-commerce online marketplace. In some embodiments, a method may include receiving at an online marketplace, from a seller through the Internet, an image of an item being listed for sale at the online marketplace and text related to the item being listed for sale; determining that the item includes a flaw based on the text related to the item being listed for sale or the image of the item; creating a flaw accentuation to the image; and creating a listing in the online marketplace for the item that includes the image and the flaw accentuation to the image.
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