- 专利标题: LEARNING DEVICE, LEARNING METHOD, AND MEASUREMENT DEVICE
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申请号: US17768386申请日: 2020-08-11
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公开(公告)号: US20230037994A1公开(公告)日: 2023-02-09
- 发明人: Ryugo FUJITA , Daisuke KAWAMURA , Yuuki NAWA , Minoru OTAKE , Tetsuya HIROTA
- 申请人: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
- 申请人地址: JP Aichi
- 专利权人: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
- 当前专利权人: KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO
- 当前专利权人地址: JP Aichi
- 优先权: JP2019-208016 20191118
- 国际申请: PCT/JP2020/030609 WO 20200811
- 主分类号: A61B5/352
- IPC分类号: A61B5/352 ; G06N20/00
摘要:
There is provided a learning device, including a learning unit that learns output related to a target feature point to be observed in a repetition section observed periodically, with the use of the first sensor data being acquired by the first system and having a time length corresponding to the repetition section, as learning data, and of teacher data based on the second sensor data acquired by the second system at a time point when a specific period of time has elapsed since a start time point of the time length related to the first sensor data, the second system being less affected by noises than the first system, in which the specific period of time is set on the basis of a time length from a start time point of the repetition section to a time point at which the target feature point is expected to appear.