发明公开
- 专利标题: System for a Microscope System and Corresponding Method and Computer Program
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申请号: US18249986申请日: 2021-10-18
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公开(公告)号: US20230404699A1公开(公告)日: 2023-12-21
- 发明人: Alvin KOK , Jiahao PAN
- 申请人: Leica Instruments (Singapore) Pte. Ltd.
- 申请人地址: SG Singapore
- 专利权人: Leica Instruments (Singapore) Pte. Ltd.
- 当前专利权人: Leica Instruments (Singapore) Pte. Ltd.
- 当前专利权人地址: SG Singapore
- 优先权: EP 203489.8 2020.10.23
- 国际申请: PCT/EP2021/078786 2021.10.18
- 进入国家日期: 2023-04-21
- 主分类号: A61B90/20
- IPC分类号: A61B90/20 ; A61B34/00
摘要:
Examples relate to a system for a microscope system, to a microscope system comprising such a system, and to a corresponding method and computer program. The system comprises one or more processors and one or more storage devices. The system is configured to obtain a trigger signal. The trigger signal indicates a desire of a user of the microscope system to display a visual representation of a control functionality associated with an input device of the microscope system. The system is configured to generate, based on the trigger signal, a visual overlay comprising the visual representation. The system is configured to provide a display signal to a display device of the microscope system, the display signal comprising the visual overlay.
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