- 专利标题: In-Situ Residual Intensity Noise Measurement Method And System
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申请号: US17819102申请日: 2022-08-11
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公开(公告)号: US20230049259A1公开(公告)日: 2023-02-16
- 发明人: Jan Amir Khan , Vijay Ramareddy
- 申请人: KVH Industries, Inc.
- 申请人地址: US RI Middletown
- 专利权人: KVH Industries, Inc.
- 当前专利权人: KVH Industries, Inc.
- 当前专利权人地址: US RI Middletown
- 主分类号: G01B9/02055
- IPC分类号: G01B9/02055 ; G01B9/02015 ; G01B9/02
摘要:
A method of determining residual intensity noise (RIN) of a sensor may comprise determining a first amplitude of a first harmonic of the sensor while a signal propagating through the sensor is modulated at a modulating frequency corresponding to twice an eigenfrequency of the sensor. The method may further comprise determining a second amplitude of a second harmonic of the sensor while the signal propagating through the sensor is modulated the modulating frequency, and determining the RIN of the sensor as a ratio of the first amplitude and the second amplitude.
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