- 专利标题: TILT ANALYSIS METHOD, RECORDING MEDIUM STORING TILT ANALYSIS PROGRAM, AND TILT ANALYSIS DEVICE
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申请号: US17822428申请日: 2022-08-25
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公开(公告)号: US20230069309A1公开(公告)日: 2023-03-02
- 发明人: Yoshihiro NISHI , Kohei SATO , Motohiro MIYAJIMA , Toshio YAMADA , Takashi TANAKA
- 申请人: TOPCON CORPORATION
- 申请人地址: JP Tokyo
- 专利权人: TOPCON CORPORATION
- 当前专利权人: TOPCON CORPORATION
- 当前专利权人地址: JP Tokyo
- 优先权: JP2021-138500 20210827
- 主分类号: G01C15/00
- IPC分类号: G01C15/00 ; G01C9/06
摘要:
A tilt analysis method analyzing a tilt of a columnar object is disclosed. The tilt analysis method includes: acquiring a reference value on the basis of a first position of a reflector of a measurement target device attached to a column foot portion of the columnar object; acquiring, in response to an execution instruction, a column top value on the basis of a second position of the reflector of the measurement target device attached to a column top of the columnar object, the execution instruction being received by an input section and inputted via a column top value acquisition instruction section displayed on a display section of a terminal device; generating tilt information indicating in which direction the columnar object tilts based on the reference value and the column top value; and causing the display section to display the tilt information including graphic display.
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