One or more implementations of the present disclosure are directed to sensor probes of measurement systems for measuring a plurality of electrical parameters, (e.g., voltage, current) of a conductor and methods for measuring same. In at least one implementation, the sensor probe integrates a Rogowski coil and a non-contact voltage sensor that are arranged relative to each other such that when positioned to measure a conductor, such as a wire, the Rogowski coil and the non-contact voltage sensor are held in proper position for measurement.