- 专利标题: Reticle Gripper Damper and Isolation System for Lithographic Apparatuses
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申请号: US17799652申请日: 2021-01-26
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公开(公告)号: US20230075162A1公开(公告)日: 2023-03-09
- 发明人: Roberto B. WIENER , Peter Conrad KOCHERSPERGER , Boris KOGAN , Martinus Agnes Willem CUIJPERS , Robert Jeffrey WADE , Shaun EVANS
- 申请人: ASML Holding N.V. , ASML Netherlands B.V.
- 申请人地址: NL Veldhoven; NL Veldhoven
- 专利权人: ASML Holding N.V.,ASML Netherlands B.V.
- 当前专利权人: ASML Holding N.V.,ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven; NL Veldhoven
- 国际申请: PCT/EP2021/051758 WO 20210126
- 主分类号: G03F7/20
- IPC分类号: G03F7/20 ; H01L21/687
摘要:
Embodiments herein describe methods, devices, and systems for a reticle gripper damper and isolation system for handling reticles and reducing vibrations in a reticle handler for lithography apparatuses and systems. A reticle handler apparatus includes a reticle handler arm, a reticle baseplate configured to hold the reticle, and a gripper arranged to connect the reticle baseplate to the reticle handler arm. The gripper includes a static structure that is coupled to the reticle handler arm, an isolation structure that is coupled to the static structure, and one or more damping elements. The gripper is configured to reduce vibrations of the reticle in the reticle handler apparatus using the one or more damping elements.
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