- 专利标题: METHOD FOR CHARACTERISING AN OBJECT BY MEANS OF ULTRASONIC WAVES HAVING DIFFERENT MODES, USING A COM
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申请号: US17997153申请日: 2021-04-26
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公开(公告)号: US20230087997A1公开(公告)日: 2023-03-23
- 发明人: Guillaume RENAUD
- 申请人: SORBONNE UNIVERSITE , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS) , INSERM (Institut National de la Santé et de la Recherche Médicale)
- 申请人地址: FR Paris; FR Paris; FR Paris
- 专利权人: SORBONNE UNIVERSITE,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS),INSERM (Institut National de la Santé et de la Recherche Médicale)
- 当前专利权人: SORBONNE UNIVERSITE,CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS),INSERM (Institut National de la Santé et de la Recherche Médicale)
- 当前专利权人地址: FR Paris; FR Paris; FR Paris
- 优先权: FRFR2004180 20200427
- 国际申请: PCT/FR2021/050717 WO 20210426
- 主分类号: A61B8/08
- IPC分类号: A61B8/08
摘要:
Disclosed is a method for characterising an object, comprising: emission of ultrasonic waves that enter an object by passing through an external interface, then reflect off an internal interface, then exit the object by passing through the external interface again, the ultrasonic waves comprising first waves having a mode that varies according to a first variation during their propagation in the object, and second waves having a mode that varies according to a second variation during their propagation in the object; reception of echo signals comprising first signals representing echoes of the first waves, and second signals representing echoes of the second waves, construction of a plurality of images showing the object, the plurality of images being constructed from the echo signals, under the assumption that two characteristics of the object are equal to two candidate values, and comprising a first image constructed from the first signals, and a second constructed from the second signals; construction of a composite image from the plurality of images; calculation of a focus metric in the composite image and, depending on the metric, selection or not of the two candidate values as values of the two characteristics. These characteristics can be used, in particular, to estimate a thickness of the object between the two interfaces.
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