Invention Application
- Patent Title: ABNORMALITY DETECTION APPARATUS, ABNORMALITY DETECTION METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM
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Application No.: US17801313Application Date: 2020-12-21
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Publication No.: US20230092448A1Publication Date: 2023-03-23
- Inventor: Umihiko ITO , Kenji KOUNO , Toshiki TAKEUCHI , Jun SAKAI , Taichi OHTSUJI
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- Priority: JP2020-034621 20200302
- International Application: PCT/JP2020/047712 WO 20201221
- Main IPC: H04W24/08
- IPC: H04W24/08 ; H04B17/309

Abstract:
An abnormality detection apparatus according to an example embodiment includes a reception unit for receiving radio waves, a feature amount extraction unit for extracting a plurality of feature amounts in a predetermined frequency band from the received radio waves, a recording unit for recording the plurality of extracted feature amounts and the frequency band in association with each other, and a processing unit for acquiring a plurality of feature amounts in a predetermined range from the plurality of accumulated feature amounts, determining whether or not the acquired feature amounts fall within a preset normal range, and generating, based on a result of the determination, an abnormality determination mask, threshold values for the plurality of feature amounts, in order to detect an abnormality of the radio waves being set in the abnormality determination mask.
Information query