- 专利标题: FIBER-COUPLED SPIN DEFECT MAGNETOMETRY
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申请号: US18084370申请日: 2022-12-19
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公开(公告)号: US20230118060A1公开(公告)日: 2023-04-20
- 发明人: Christian Thieu Nguyen , Stefan Bogdanovic
- 申请人: X Development LLC
- 申请人地址: US CA Mountain View
- 专利权人: X Development LLC
- 当前专利权人: X Development LLC
- 当前专利权人地址: US CA Mountain View
- 主分类号: G01R33/028
- IPC分类号: G01R33/028 ; G01N24/10 ; G01R33/032
摘要:
A magnetometer includes an electron spin defect body including a plurality of lattice point defects. A microwave field transmitter is operable to apply a microwave field to the electron spin defect body. An optical source is configured to emit input light of a first wavelength that excites the plurality of lattice point defects of the electron spin defect body from a ground state to an excited state. A first optical fiber has an input end optically coupled to the optical source and an output end. The output end is attached to a first face of the electron spin defect body and is arranged to direct the input light into the first face of the electron spin defect body. A second optical fiber has an output end and an input end. A photodetector is optically coupled to the output end of the second optical fiber.
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