Invention Publication
- Patent Title: OUT-OF-PROCESS HIT-TESTING FOR ELECTRONIC DEVICES
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Application No.: US18217498Application Date: 2023-06-30
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Publication No.: US20240004538A1Publication Date: 2024-01-04
- Inventor: Mark A. EBBOLE , Andrew T. FINKE , Abhinay ASHUTOSH
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Main IPC: G06F3/04847
- IPC: G06F3/04847 ; G06F3/0481

Abstract:
Out-of-process hit-testing can provide increased privacy and efficiency in computer user input systems. In an aspect, an application specifies a control style for a UI window to be managed separately from the application, such as by a system process running outside of the application process. When a user input is received at a location corresponding to a part of the application UI that is separate from the UI window for which the control style has been specified, the user input may be redirected to the UI window for which the control style has been specified.
Public/Granted literature
- US12056344B2 Out-of-process hit-testing for electronic devices Public/Granted day:2024-08-06
Information query
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