Invention Publication
- Patent Title: MEASUREMENT SYSTEM FOR PROCESS MONITORING
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Application No.: US18037205Application Date: 2021-11-05
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Publication No.: US20240019343A1Publication Date: 2024-01-18
- Inventor: Jung Hwan SEO
- Applicant: Hongik University Industry-Academia Cooperation Foundation
- Applicant Address: KR Seoul
- Assignee: Hongik University Industry-Academia Cooperation Foundation
- Current Assignee: Hongik University Industry-Academia Cooperation Foundation
- Current Assignee Address: KR Seoul
- Priority: KR 20200152846 2020.11.16 KR 20210147802 2021.11.01
- International Application: PCT/KR2021/016020 2021.11.05
- Date entered country: 2023-05-16
- Main IPC: G01N1/24
- IPC: G01N1/24 ; G01N21/33

Abstract:
A measurement system for measuring a status of a process of a treatment apparatus for treating a component in a chamber to generate a gas mixture including gaseous phase materials includes a sampling unit configured to selectively communicate an exhaust pipe for discharging the gas mixture including the gaseous phase materials from the chamber to sample the gas mixture from the exhaust pipe as much as a predetermined time or a predetermined volume; and a detection unit configured to separate and detect the gaseous phase materials included in the gas mixture sampled by the sampling unit into substances.
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