- 专利标题: SCINTILLATOR ARRAY, AND RADIATION DETECTOR AND RADIATION INSPECTION APPARATUS USING THE SAME
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申请号: US18461716申请日: 2023-09-06
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公开(公告)号: US20240045083A1公开(公告)日: 2024-02-08
- 发明人: Hiroyasu KONDO , Makoto HAYASHI , Kazumitsu MORIMOTO
- 申请人: KABUSHIKI KAISHA TOSHIBA , TOSHIBA MATERIALS CO., LTD.
- 申请人地址: JP Tokyo
- 专利权人: KABUSHIKI KAISHA TOSHIBA,TOSHIBA MATERIALS CO., LTD.
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA,TOSHIBA MATERIALS CO., LTD.
- 当前专利权人地址: JP Tokyo; JP Yokohama-Shi
- 优先权: JP 21037199 2021.03.09
- 主分类号: G01T1/20
- IPC分类号: G01T1/20 ; G01T1/202
摘要:
To provide an X-ray ceramic scintillator array as well as a radiation detector and a radiation inspection apparatus using the same, which prevents a resin used for a reflective layer of the scintillator array from being colored due to X-ray irradiation so as to realize a significant improvement against the output drop of the scintillator array. The resin used for the reflective layer of the X-ray ceramic scintillator array has a feature wherein a ratio of absorption intensity in a wavenumber range of 1490 cm−1 to 1750 cm−1 to absorption intensity in a wavenumber range of 2500 cm−1 to 2990 cm−1 has a value that falls within a specific range in an absorption spectrum based on Fourier transform infrared spectrometry (FT-IR).
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