Invention Publication
- Patent Title: ANALYZING MEASUREMENT RESULTS OF A TARGET SYSTEM
-
Application No.: US18267195Application Date: 2021-11-29
-
Publication No.: US20240046149A1Publication Date: 2024-02-08
- Inventor: Viivi UURTIO , Qi YU , Rasmus HEIKKILÄ , Petteri LUNDÉN , Antti LISKI
- Applicant: Elisa Oyj
- Applicant Address: FI Helsinki
- Assignee: Elisa Oyj
- Current Assignee: Elisa Oyj
- Current Assignee Address: FI Helsinki
- Priority: FI 206329 2020.12.18
- International Application: PCT/FI2021/050820 2021.11.29
- Date entered country: 2023-06-14
- Main IPC: G06N20/00
- IPC: G06N20/00 ; G06F17/16

Abstract:
Analyzing measurement results of a target system. The analysis is performed by receiving a first matrix including first measurement results of the target system; training a matrix decomposition model with the first matrix to obtain a third matrix of normal or stable measurement results and a fourth matrix of anomalous or unstable measurement results; receiving a second matrix including second measurement results of the target system, wherein the second measurement results are later measurement results compared to the first measurement results; selecting from the third matrix a subset that matches with the second matrix; subtracting the selected subset from the second matrix to obtain a fifth matrix; outputting the fifth matrix or information derived from the fifth matrix for the purpose of evaluating performance of the target system.
Information query