Invention Publication
- Patent Title: PROCESSING DEVICE, ABNORMALITY DETECTION SYSTEM, ABNORMALITY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
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Application No.: US18022668Application Date: 2020-08-28
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Publication No.: US20240054626A1Publication Date: 2024-02-15
- Inventor: Yoshimasa ONO , Akira TSUJI
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- International Application: PCT/JP2020/032595 2020.08.28
- Date entered country: 2023-08-24
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/73

Abstract:
Provided is a processing device capable of accurately identifying an abnormal part. A processing device (1) according to the present disclosure includes a first difference calculation unit (11) that calculates a difference between a plurality of reference point groups, a dynamic point group extraction unit (15) that extracts a dynamic point group being a point group involving a change from the reference point groups on the basis of a calculation result in the first difference calculation unit (11), a second difference calculation unit (12) that calculates a difference between an inspection point group acquired after the reference point group and the reference point group and generates a differential point group, a point group removal unit (16) that removes a point group corresponding to the dynamic point group from the differential point group generated in the second difference calculation unit (12), and an abnormal part identification unit (17) that identifies an abnormal part of the object to be measured on the basis of a differential point group from which the point group corresponding to the dynamic point group is removed.
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