- 专利标题: FLIP-FLOPS AND SCAN CHAIN CIRCUITS INCLUDING THE SAME
-
申请号: US18194643申请日: 2023-04-02
-
公开(公告)号: US20240061039A1公开(公告)日: 2024-02-22
- 发明人: Byounggon Kang , Dalhee Lee , Giyoung Yang , Minji Kim , Taejung Seol , Jaebeom Yang
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR 20220102505 2022.08.17
- 主分类号: G01R31/3185
- IPC分类号: G01R31/3185 ; G01R31/317
摘要:
A flip-flop circuit may include a selection circuit, a master latch circuit and a slave latch circuit. The selection circuit includes a multiplexer and first and second inverters. The multiplexer outputs a data signal or a scan input signal to a first node in response to an enable signal. The first inverter is connected to the first node and provides an inversion of a signal of the first node to a second node in response to a clock signal. The second inverter is connected to the second node and provides an inversion of the signal of the second node to a third node in response to the clock signal and a signal of a fourth node. The master latch circuit is connected between the third and fourth nodes. The slave latch circuit is connected between the fourth node and an output terminal of the flip-flop circuit.
公开/授权文献
- US12044733B2 Flip-flops and scan chain circuits including the same 公开/授权日:2024-07-23
信息查询
IPC分类: