Invention Publication
- Patent Title: METHOD OF MEASURING THICKNESS OF DISPLAY DEVICE
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Application No.: US18211456Application Date: 2023-06-19
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Publication No.: US20240068800A1Publication Date: 2024-02-29
- Inventor: Sang Heon YE
- Applicant: Samsung Display Co., LTD.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., LTD.
- Current Assignee: Samsung Display Co., LTD.
- Current Assignee Address: KR Yongin-si
- Priority: KR 20220107783 2022.08.26
- Main IPC: G01B11/06
- IPC: G01B11/06 ; G06V40/13
Abstract:
A method of measuring a thickness of a display device according to an embodiment includes: acquiring a sensing value by scanning external light to a photo sensing pixel of the display device; and measuring an organic layer thickness at a tag part of the display device and comparing the measured thickness with the sensing value.
Information query
