Invention Publication
- Patent Title: SNR DETECTION WITH FEW-SHOT TRAINED MODELS
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Application No.: US18452664Application Date: 2023-08-21
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Publication No.: US20240070232A1Publication Date: 2024-02-29
- Inventor: Wei Cheng , Jingchao Ni , Liang Tong , Haifeng Chen , Yizhou Zhang
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: US NJ Princeton
- Assignee: NEC Laboratories America, Inc.
- Current Assignee: NEC Laboratories America, Inc.
- Current Assignee Address: US NJ Princeton
- Main IPC: G06F18/2413
- IPC: G06F18/2413 ; G06F18/2415 ; H04B10/69

Abstract:
Methods and systems for training a model include determining class prototypes of time series samples from a training dataset. A task corresponding to the time series samples is encoded using the class prototypes and a task-level configuration. A likelihood value is determined based on outputs of a time series density model, a task-class distance from a task embedding model, and a task density model. Parameters of the time series density model, the task embedding model, and the task density model are adjusted responsive to the likelihood value.
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