A method for inspecting a power storage device for short circuit includes: adjusting a plurality of power storage devices to a first device voltage; restraining the power storage devices; measuring a pre-leaving device voltage, leaving the power storage devices, and measuring a post-leaving device voltage; obtaining a voltage drop rate; and determining whether or not a restrained device is short-circuited using a voltage drop rate. The method further includes: calculating a largest adjustment timing difference between an oldest adjustment completion time of an oldest adjusted device and a newest adjustment completion time of a newest adjusted device, after adjusting the voltage but before measuring the pre-leaving voltage; obtaining a shortest standby time from the largest adjustment timing difference; and deferring the measuring of the pre-leaving voltage until the shortest standby time elapses.