Invention Publication
- Patent Title: UTTERANCE TEST METHOD FOR UTTERANCE DEVICE, UTTERANCE TEST SERVER, UTTERANCE TEST SYSTEM, AND PROGRAM
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Application No.: US17765589Application Date: 2021-07-14
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Publication No.: US20240111645A1Publication Date: 2024-04-04
- Inventor: Hiroki URABE , Kentaro NAKAI , Satoru MATSUNAGA , Yoshiki OHASHI
- Applicant: Panasonic Intellectual Property Management Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee: Panasonic Intellectual Property Management Co., Ltd.
- Current Assignee Address: JP Osaka
- Priority: JP 21064959 2021.04.06
- International Application: PCT/JP2021/026410 2021.07.14
- Date entered country: 2022-10-13
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G10L13/00 ; H04L12/28

Abstract:
An utterance test method for an utterance device, an utterance test server, an utterance test system, and a program perform an utterance test on a test device (20). The utterance test system includes at least one utterance device (20) capable of uttering, a terminal device (30), and an utterance test server (10). The utterance test server (10) receives an utterance test start command from the terminal device (30), sets at least one utterance device (20) to be a test device (20) as a target of an utterance test, sets test content of the utterance test, and causes the test device (20) to utter the test content.
Public/Granted literature
- US12141043B2 Utterance test method for utterance device, utterance test server, utterance test system, and program Public/Granted day:2024-11-12
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