Described is a scintigraphic measurement device with extended area, including a measurement structure having a matrix of scintillation crystals and an optoelectronic network for converting photons into electrical signals; a collimator with collimation channels; an electronic processing unit applied to the measurement structure processing the electrical signals generated by the measurement structure. The optoelectronic network has a matrix of optoelectronic conversion modules interconnected according to a two-dimensional distribution to cover the entire measurement area, each optoelectronic conversion module including a two-dimensional matrix of individual elements “Multi Pixel Photon Counter” or individual “Silicon PhotoMultiplier” elements electrically interconnected, and wherein the optoelectronic conversion modules are electrically connected to each other along rows and columns by channels for each row or column and the electronic processing unit is connected to the optoelectronic network for measuring a total electric current of each channel delivered by the optoelectronic conversion modules positioned on the channel.